この記事は２年以上前に書いたものです。
そのため情報が古い可能性があります。ご了承ください。m(_ _)m
そのため情報が古い可能性があります。ご了承ください。m(_ _)m
FreeBSD8.0なサーバで作業してると、ちょくちょく応答が返ってこない事があっって調べてみたら、hddが１台Errorを吐いてた。
% sudo smartctl -a /dev/ad5
smartctl 5.39.1 2010-01-28 r3054 [FreeBSD 8.0-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD800AAJS-18TDA1
Serial Number: WD-WMAM9TL42485
Firmware Version: 01.00A04
User Capacity: 80,000,000,000 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Sep 26 20:54:20 2010 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (2700) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 36) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 170 166 021 Pre-fail Always - 2500
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 44
5 Reallocated_Sector_Ct 0x0033 128 128 140 Pre-fail Always FAILING_NOW 573
7 Seek_Error_Rate 0x000e 200 197 051 Old_age Always - 0
9 Power_On_Hours 0x0032 067 067 000 Old_age Always - 24673
10 Spin_Retry_Count 0x0012 100 253 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 44
194 Temperature_Celsius 0x0022 103 090 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 171 171 000 Old_age Always - 29
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 356 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 356 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 01 01 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 ff 01 01 00 00 00 00 9d+19:57:52.282 NOP [Reserved subcommand]
90 ff aa 55 00 00 00 00 9d+19:57:52.279 EXECUTE DEVICE DIAGNOSTIC
00 00 01 01 00 00 00 00 9d+19:57:52.272 NOP [Abort queued commands]
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
Error 355 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 01 01 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 01 01 00 00 00 00 9d+19:57:52.272 NOP [Abort queued commands]
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
Error 354 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 40
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
Error 353 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 10 00 00 00 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 00 00 9d+19:53:20.676 SET FEATURES [Set transfer mode]
Error 352 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 00 00 9d+19:53:20.676 SET FEATURES [Set transfer mode]
c8 00 01 00 00 00 00 00 9d+19:53:15.464 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctl 5.39.1 2010-01-28 r3054 [FreeBSD 8.0-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD800AAJS-18TDA1
Serial Number: WD-WMAM9TL42485
Firmware Version: 01.00A04
User Capacity: 80,000,000,000 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Sep 26 20:54:20 2010 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (2700) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 36) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 170 166 021 Pre-fail Always - 2500
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 44
5 Reallocated_Sector_Ct 0x0033 128 128 140 Pre-fail Always FAILING_NOW 573
7 Seek_Error_Rate 0x000e 200 197 051 Old_age Always - 0
9 Power_On_Hours 0x0032 067 067 000 Old_age Always - 24673
10 Spin_Retry_Count 0x0012 100 253 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 44
194 Temperature_Celsius 0x0022 103 090 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 171 171 000 Old_age Always - 29
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 356 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 356 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 01 01 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 ff 01 01 00 00 00 00 9d+19:57:52.282 NOP [Reserved subcommand]
90 ff aa 55 00 00 00 00 9d+19:57:52.279 EXECUTE DEVICE DIAGNOSTIC
00 00 01 01 00 00 00 00 9d+19:57:52.272 NOP [Abort queued commands]
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
Error 355 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 01 01 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 00 01 01 00 00 00 00 9d+19:57:52.272 NOP [Abort queued commands]
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
Error 354 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 40
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 00 00 9d+19:57:40.985 FLUSH CACHE EXT
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
Error 353 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 10 00 00 00 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 10 00 00 00 00 00 9d+19:53:20.679 SET MULTIPLE MODE
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 00 00 9d+19:53:20.676 SET FEATURES [Set transfer mode]
Error 352 occurred at disk power-on lifetime: 23670 hours (986 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 9d+19:53:20.679 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 9d+19:53:20.678 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 9d+19:53:20.677 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 00 00 9d+19:53:20.676 SET FEATURES [Set transfer mode]
c8 00 01 00 00 00 00 00 9d+19:53:15.464 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
「ATA Error Count: 356」！！
＞ 5 Reallocated_Sector_Ct 0x0033 128 128 140 Pre-fail Always FAILING_NOW 573
FAILING_NOW！！！
とりあえず、raid1から外す。
% gmirror status
Name Status Components
mirror/gm0 COMPLETE ad6
ad5
ad4
% sudo gmirror remove -v gm0 ad5
Done.
% gmirror status
Name Status Components
mirror/gm0 COMPLETE ad6
ad4
Name Status Components
mirror/gm0 COMPLETE ad6
ad5
ad4
% sudo gmirror remove -v gm0 ad5
Done.
% gmirror status
Name Status Components
mirror/gm0 COMPLETE ad6
ad4
$ sudo portupgrade -a
を流してるけど、かなり快適。やっぱこいつが原因か～。
でも、１台ちゃんと動作しないだけで、システム全体が一時的に止まるのはどうかと。
完璧に死んだわけではなく、かろうじて生きてるから。とか？
それとも設定がマズイのかな。。
一応テストを流しておく。
% sudo smartctl -a -tlong /dev/ad5
smartctl 5.39.1 2010-01-28 r3054 [FreeBSD 8.0-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD800AAJS-18TDA1
Serial Number: WD-WMAM9TL42485
Firmware Version: 01.00A04
User Capacity: 80,000,000,000 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Sep 26 21:17:57 2010 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
・・・
=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".
Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.
Testing has begun.
Please wait 36 minutes for test to complete.
Test will complete after Sun Sep 26 21:53:57 2010
Use smartctl -X to abort test.
smartctl 5.39.1 2010-01-28 r3054 [FreeBSD 8.0-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD800AAJS-18TDA1
Serial Number: WD-WMAM9TL42485
Firmware Version: 01.00A04
User Capacity: 80,000,000,000 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Sep 26 21:17:57 2010 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
・・・
=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".
Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.
Testing has begun.
Please wait 36 minutes for test to complete.
Test will complete after Sun Sep 26 21:53:57 2010
Use smartctl -X to abort test.